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Home > Light-emitting Device with Improved Tolerance to Crystalline Defects and Damage

Defect Resistant Red LEDs

Light-emitting Device with Improved Tolerance to Crystalline Defects and Damage [1]

Standard red LEDs suffer from rapid degradation and low efficiency, which becomes increasingly poor at smaller dimensions. Dr. Lee’s novel LED design integrates InP quantum dots to overcome the deleterious sidewall recombination that reduces the performance of conventional red LEDs. This technology dramatically increases the defect tolerance of red LEDs, with devices showing comparable performance when grown on a range of surfaces including GaAs and GaAs/Si.

Minjoo Lawrence
Lee

Inventors:

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Links
[1] https://origin.otm.illinois.edu/technologies/light-emitting-device-improved-tolerance-crystalline-defects-and-damage