UIUC Office of Technology Management
Published on UIUC Office of Technology Management (https://origin.otm.illinois.edu)

Home > Visualizable Detection of Nanoscale Perturbations

Visualizable Detection of Nanoscale Perturbations

Visualizable Detection of Nanoscale Perturbations [1]

This technology adapts conventional optical microscopes for visualizable detection and sensing in nanometric volumes. Conversion is fast and low cost, and the resulting device is easy to operate, label-free, and non-destructive.

Applications

Microscopy, semiconductor wafer inspection, characterizing physical, biological, chemical properties of materials, bio-sensing

Lynford
Goddard

Inventors:

The Office of Technology Management
319 Ceramics Building
105 South Goodwin Avenue
Urbana, IL 61801
Phone: 217.333.7862
Fax: 217.265.5530
Email: otm@illinois.edu

Source URL:https://origin.otm.illinois.edu/technologies/visualizable-detection-nanoscale-perturbations

Links
[1] https://origin.otm.illinois.edu/technologies/visualizable-detection-nanoscale-perturbations